High-Resolution Imaging and Spectrometry of Materials (eBook, PDF)

Redaktion: Ernst, Frank; Rühle, Manfred

• Format: PDF

Produktbeschreibung

This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.

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Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 442
• Erscheinungstermin: 9. März 2013
• Englisch
• ISBN-13: 9783662077665
• Artikelnr.: 53145621

Inhaltsangabe

1 Microcharacterisation of Materials.- 2 Electron Scattering.- 3 Structure Determination by Quantitative High-Resolution Electron Microscopy (Q-HRTEM).- 4 Quantitative Analytical Transmission Electron Microscopy.- 5 Advances in Electron Optics.- 6 Tomography by Atom Probe Field Ion Microscopy.- 7 Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM).- 8 Multi-Method High-Resolution Surface Analysis with Slow Electrons.- 9 From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites.- 10 Microstructural Characterization of Materials: An Assessment.