Badih El-Kareh

Silicon Devices and Process Integration (eBook, PDF)

Deep Submicron and Nano-Scale Technologies

• Format: PDF

Produktbeschreibung

This book includes discussion of silicon materials and electrical engineering properties as used in the design of analog components. Due to the author's background at Texas Instruments, the book will have an emphasis on newer process integration techniques and technology to help professional engineers in the field understand and develop electrical components.

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Produktdetails

• Verlag: Springer US
• Seitenzahl: 598
• Erscheinungstermin: 9. Januar 2009
• Englisch
• ISBN-13: 9780387690100
• Artikelnr.: 37287780

Inhaltsangabe

Properties of the Silicon Crystal. Valence-bond and energy-band models. Thermal equilibrium statistics. Carrier transport mechanisms. Non-equilibrium conditions and carrier lifetime.- Junctions and Contacts. Ohmic, non-ohmic, and rectifying contacts. PN junctions, homo- and hetero-junctions. Contact und junction characterization, parameter extraction. Varactors.- Junction Field-Effect Transistor, JFET. Structure and mode of operation. Physics of JFET. JFET characterization and parameter extraction. High-voltage applications. Parasitic effects.- Bipolar Junction Transistor, BJT. Structure and mode of operation. Physics of BJT. Heterojunction Bipolar Transistor, HBT. Transistor characterization and parameter extraction. High-voltage applications.- Parasitic effects.