Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition) - Fearn, Sarah; Shard, Alexander
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In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.

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Produktbeschreibung
In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.
Autorenporträt
Sarah Fearn obtained her PhD from the Department of Materials, Imperial College in 2000. After working in commercial SIMS analysis for two years, she returned to academia in2002. Since then she has worked on a variety of research projects that have all applied SIMS as the main characterisation tool for understanding a range of material science issues such as glass corrosion, to calcium deposits in eye tissue. Over the last 20 years she has published ~90 papers spanning a wide range of material science issues and the application of SIMS. Since 2012 she has been in charge of the surface analysis laboratory in the Department of Materials at Imperial College.