Buch
Washington, SPIE - The International Society for Optical Engineering
Buch
2003
Spy Publishing
![Handbook of Critical Dimension Metrology and Process Control. Proceedings of a conference held 28-29 September 1993 Monterey, California. [= Critical Reviews of Optical Science and Technology Volume CR52].](https://bilder.buecher.de/produkte/25/25295/25295903m.jpg "Handbook of Critical Dimension Metrology and Process Control. Proceedings of a conference held 28-29 September 1993 Monterey, California. [= Critical Reviews of Optical Science and Technology Volume CR52]."){kind=small}
Buch
Bellingham, SPIE Optical Engineering Press, 1994
Buch mit Leinen-Einband
The Game Plan
2007
Macmillan Publishers International / Spy Publishing
Buch
Washington, Spie Optical Engineering Press (SPIE Milestone Series, Vol. MS 109)
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