Nicht lieferbar
An Introduction to Surface Analysis by XPS and AES - Watts, John F.; Wolstenholme, John
Schade – dieser Artikel ist leider ausverkauft. Sobald wir wissen, ob und wann der Artikel wieder verfügbar ist, informieren wir Sie an dieser Stelle.
  • Broschiertes Buch

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
- Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
- Provides descriptions of latest instruments and techniques.
- Includes a detailed glossary of key surface analysis terms.
Inhaltsverzeichnis:
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative…mehr

Andere Kunden interessierten sich auch für
Produktbeschreibung
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
- Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
- Provides descriptions of latest instruments and techniques.
- Includes a detailed glossary of key surface analysis terms.

Inhaltsverzeichnis:
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.
Autorenporträt
J. F. Watts, The Surface Analysis Laboratory, School of Engineering, Univ. of Surrey, UK; J. Wolstenholme, Thermo VG Scientific, East Grinstead, UK