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  • Broschiertes Buch

The book serves as a supplementary compendium to "Applied Nuclear Data, Volume 1 - Radionuclide Handbook."It presents a separate, comprehensive list of energies and isotopes covering as many radioisotopes as possible, based on the Radionuclide Handbook, which includes approximately 290 radioisotopes. The compilation includes all decay energies as well as energies modified through interactions with the detec-tor. Additionally, it provides information on half-lives, intensities (including those relevant to decay sys-tems in parent/daughter equilibrium), and gamma lines affected by escape…mehr

Produktbeschreibung
The book serves as a supplementary compendium to "Applied Nuclear Data, Volume 1 - Radionuclide Handbook."It presents a separate, comprehensive list of energies and isotopes covering as many radioisotopes as possible, based on the Radionuclide Handbook, which includes approximately 290 radioisotopes. The compilation includes all decay energies as well as energies modified through interactions with the detec-tor. Additionally, it provides information on half-lives, intensities (including those relevant to decay sys-tems in parent/daughter equilibrium), and gamma lines affected by escape processes such as Single Es-cape, Double Escape, and X-ray Escape (SE/DE/XE).The dataset also accounts for energies influenced by coincidence decays or random temporal events, such as Coincidence Summing and Random Summing (CS/RS). Furthermore, it includes details on parent and daughter nuclides, primary production pathways, and many other useful parameters to support practical applications and research.Energy - Gamma- transitions- X-rays: K 1, K 2, Kbeta1-Kbeta3, L- Escape and Sum Energies - Bold face: leading Gamma-energies- In keVIntensity - Absolute & in equilibrium- Exited states, e.g., 1. exc. to 0.- In %Half-Live- Parent/daughter nucleus- Absolute & in equilibrium- Inclusive stable isotopes- In y, d, h, m, s, ms, µsRadio-Isotopes- Parent/daughter nucleus- Induced radiation- Short name- X-rays, DE/SE/XE, CS/RS - Excited isotopesDecay Information - Decay modes of parent nuclei- Decay to daughter nuclei- Production of parent nuclei- Decay chains of mother nuclei- Absolute, equilibrium, reference, ... - Particle n, p, µ, ... interaction- SE/DE/XE & CS/RS observation- Line broadening (Li-7)- Asymmetric peaks: Ge lattice recoil
Autorenporträt
He is currently responsible for Research and Development at ISuS (Institute for Spectrometry and Radiation Protection) in Schliersee, Germany. After completing his engineering studies with a degree in Physical Engineering at the University of Applied Sciences in Isny, Germany, he continued his academic path at the university level. Following undergraduate studies at the Institute of Atomic Physics, he earned a Master's degree (Diploma in Physics) from the University of Heidelberg and subsequently obtained a doctorate (Dr. rer. nat.) at the Max Planck Institute for Nuclear Physics in Heidelberg. During his doctoral research, he worked as a development engineer specializing in nuclear and applied electronics. In 1986, he transitioned to industry, joining EG&G ORTEC in Munich, where he spent eight years focusing on radiation measurement, nuclear instrumentation, and system development. In 1993, he founded the private R&D institute ISuS in Schliersee and served as its director until 1996. From 1996 to 2015, he led the scientific working group on personal dosimetry, initiating numerous research projects in internal and external dosimetry, and managed the official personal dose monitoring center at GSF (now Helmholtz Zentrum Munich). Since 2015, his research interests have brought him back to the R&D department at ISuS. He is a long-standing member of the Professional Association for Radiation Protection and has contributed to several DIN working groups over many years. He is also an active member of the AKD Dosimetry Working Group, EURADOS, and the IEC. In addition, he lectures at various institutes on nuclear technology and radiation protection, and has authored more than 120 technical and scientific publications.