D. Browning / J. Pennycook (eds.)

Characterization of High Tc Materials and Devices by Electron Microscopy

Herausgeber: Browning, Nigel D.; Pennycook, Stephen J.

• Gebundenes Buch

Produktbeschreibung

A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

Produktdetails

• Verlag: Cambridge University Press
• Seitenzahl: 406
• Erscheinungstermin: 4. Februar 2015
• Englisch
• Abmessung: 250mm x 175mm x 26mm
• Gewicht: 877g
• ISBN-13: 9780521554909
• ISBN-10: 052155490X
• Artikelnr.: 32735263

Inhaltsangabe

List of contributors; Preface; 1. High-resolution transmission electron
microscopy S. Horiuchi and L. He; 2. Holography in the transmission
electron microscope A. Tonomura; 3. Microanalysis by scanning transmission
electron microscopy L. M. Brown and J. Yuan; 4. Specimen preparation for
transmission electron microscopy J. G. Wen; 5. Low-temperature scanning
electron microscopy R. P. Huebener; 6. Scanning tunneling microscopy M. E.
Hawley; 7. Identification of new superconducting compounds by electron
microscopy G. Van Tendeloo and T. Krekels; 8. Valence band electron energy
loss spectroscopy (EELS) of oxide superconductors Y. Y. Wang and V. P.
Dravid; 9. Investigation of charge distribution in Bi2Sr2CaCu2O8 and
YBa2Cu3O7 Y. Zhu; 10. Grain boundaries in high Tc materials: transport
properties and structure K. L. Merkle, Y. Gao and B. V. Vuchic; 11. The
atomic structure and carrier concentration at grain boundaries in
YBa2Cu3O7-d N. D. Browning, M. F. Chisholm and S. J. Pennycook; 12.
Microstructures in superconducting YBa2Cu3O7 thin films A. F. Marshall; 13.
Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson
junctions by high-resolution electron microscopy C. L. Jia and K. Urban;
14. Controlling the structure and properties of high Tc thin-film devices
E. Olsson.