29,99 €
inkl. MwSt.
Versandkostenfrei*
Versandfertig in 6-10 Tagen
payback
15 °P sammeln
  • Broschiertes Buch

This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and…mehr

Produktbeschreibung
This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences.
Autorenporträt
Dr.-Ing. Hafid Zouihri is Professor of Materials Science at Moulay Ismail University, Morocco. His research focuses on perovskites, borophosphates, and advanced materials for environmental remediation, energy conversion, and computational modeling using DFT and molecular dynamics.