Reliability Issues and Approaches in MOSFET circuits - Kumar, Amit
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This is the first publication by me on Reliability issues of nano scale devices. As the technology is shrinking the Reliability issues increase exponentially. In this work i had evaluated the life time of a device if under the different condition. Worked on different latest devices like Silicon on Insulator(SOI) and LD MOS. We had proposed different techniques to enhance or increase the life span of devices. Because they impact the operation of different crucial application like automobile, space.

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Produktbeschreibung
This is the first publication by me on Reliability issues of nano scale devices. As the technology is shrinking the Reliability issues increase exponentially. In this work i had evaluated the life time of a device if under the different condition. Worked on different latest devices like Silicon on Insulator(SOI) and LD MOS. We had proposed different techniques to enhance or increase the life span of devices. Because they impact the operation of different crucial application like automobile, space.
Autorenporträt
Dr. M. B. Rajpur (geb. 1990) schloss 2013 sein Studium der Veterinärmedizin und des AH-Bereichs an der Sardarkrushinagar Dantiwada Agricultural University (SDAU), Gujarat, mit einem Bachelor of Veterinary and AH Extension ab. Seinen Master of Veterinary and AH Extension erlangte er 2015 an der Sardarkrushinagar Dantiwada Agricultural University (SDAU), Gujarat. Seinen Ph.D. (Veterinärmedizin und AH Extension) erlangte er 2023 an der Kamdhenu University, Gujarat.