Semiconductor Devices in Harsh Conditions

Herausgeber: Weide-Zaage, Kirsten; Chrzanowska-Jeske, Malgorzata

• Broschiertes Buch

Produktbeschreibung

The book focuses on radiation, operating conditions, sensor systems, and package and system design.

Produktdetails

• Verlag: CRC Press
• Seitenzahl: 258
• Erscheinungstermin: 30. September 2020
• Englisch
• Abmessung: 234mm x 156mm x 14mm
• Gewicht: 398g
• ISBN-13: 9780367656362
• ISBN-10: 0367656361
• Artikelnr.: 59983132

Inhaltsangabe

Section I Radiation. Commercial Off-the-Shelf Components in Space
Applications. Soft Errors in Digital Circuits Subjected to Natural
Radiation: Characterisation, Modelling and Simulation Issues. Simulation of
Single-Event Effects on Fully Depleted Siliconon-Insulator (FDSOI) CMOS.
Section II Sensors and Operating Conditions. Electronic Sensors for the
Detection of Ovarian Cancer. Sensors and Sensor Systems for Harsh
Environment Applications. III-Nitride Electronic Devices for Harsh
Environments. Section III Packaging and System Design. Packaging for
Systems in Harsh Environments. Corrosion Resistance of Lead-Free Solders
under Environmental Stress. From Deep Submicron Degradation Effects to
Harsh Operating Environments: A Self-Healing Calibration Methodology for
Performance and Reliability Enhancement. Role of Diffusional Interfacial
Sliding during Temperature Cycling and Electromigration-Induced Motion of
Copper Through Silicon Via.