Storage Reliability and Lifetime Prediction of Electromagnetic Relays - Wang, Zhaobin
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As a critical component in electrical and electronic systems, electromagnetic relays are required to meet stringent storage reliability standards. However, current research on their storage reliability remains limited, with existing studies facing several issues: incomplete parameter monitoring during testing, unclear causes of performance variation, insufficient analysis of stress relaxation failure mechanisms, lack of well-defined characterization parameters, suboptimal data modeling methods, and inadequate evaluation and prediction approaches. Consequently, advancing the analysis of storage…mehr

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Produktbeschreibung
As a critical component in electrical and electronic systems, electromagnetic relays are required to meet stringent storage reliability standards. However, current research on their storage reliability remains limited, with existing studies facing several issues: incomplete parameter monitoring during testing, unclear causes of performance variation, insufficient analysis of stress relaxation failure mechanisms, lack of well-defined characterization parameters, suboptimal data modeling methods, and inadequate evaluation and prediction approaches. Consequently, advancing the analysis of storage reliability and the development of lifetime prediction methods for electromagnetic relays has become an urgent challenge.
Autorenporträt
Zhaobin Wang joined Jiangsu University of Science and Technology, China in 2007 and is currently an Assistant Professor. He received the Ph.D. degree in Electric Machines and Electric Apparatus from Harbin Institute of Technology. His research interest includes storage reliability, testing technique and life - prediction of electrical apparatus.