Universal Threats in Expert Applications and Solutions

Proceedings of 4th UNI-TEAS 2025, Volume 1
Herausgegeben:Rathore, Vijay Singh; R. S. Tavares, Joao Manuel; Hanumanthappa, M.; Surendiran, B.

• Broschiertes Buch

Produktbeschreibung

This book presents high-quality, peer-reviewed papers from 4th International Conference on Universal Threats in Expert Applications and Solutions" (UNI-TEAS 2025), jointly being organized by IES University, Bhopal, and Shree KKarni Universe College, Jaipur, in association with CSI Jaipur Chapter and Jaipur ACM Professional Chapter during February 1 4, 2025. The book is a collection of innovative ideas from researchers, scientists, academicians, industry professionals, and students. The book covers a variety of topics, such as expert applications and artificial intelligence/machine learning; advance web technologies such as IoT, big data, and cloud computing in expert applications; information and cyber security threats and solutions, multimedia applications in forensics, security and intelligence; advancements in app development; management practices for expert applications; and social and ethical aspects in expert applications through applied sciences.

Produktdetails

• Lecture Notes in Networks and Systems 1450
• Verlag: Springer / Springer Nature Singapore / Springer, Berlin
• Artikelnr. des Verlages: 978-981-96-7288-2
• Seitenzahl: 500
• Erscheinungstermin: August 2025
• Englisch
• Abmessung: 235mm x 155mm
• ISBN-13: 9789819672882
• Artikelnr.: 73892543

Inhaltsangabe

Exploring the impact and applications of data science and big data in promoting sustainability.- Improving Data Mining Reliability through Applied C-B Techniques for Addressing Misplaced Values.- Comparative Analysis of NSAI and Traditional Neural Networks for Visual Question Answering on DAQUAR Datasets.- Comparative Analysis of Deep Learning Models for Cassava Disease on Small and Large Datasets.- Solar Intelligence Predictive Models for Power Generation And Radiation.- Advancing Intrusion Detection with Deep Learning: Techniques, Limitations, and Future Trends.