Metin Tolan

X-Ray Scattering from Soft-Matter Thin Films

Materials Science and Basic Research

• Broschiertes Buch

Produktbeschreibung

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

Produktdetails

• Springer Tracts in Modern Physics 148
• Verlag: Springer / Springer Berlin Heidelberg / Springer, Berlin
• Artikelnr. des Verlages: 978-3-662-14218-9
• Seitenzahl: 212
• Erscheinungstermin: 3. Oktober 2013
• Englisch
• Abmessung: 235mm x 155mm x 12mm
• Gewicht: 346g
• ISBN-13: 9783662142189
• ISBN-10: 366214218X
• Artikelnr.: 39492845

Autorenporträt

Metin Tolan, born in 1965, is Professor of Experimental Physics at the Technical University of Dortmund. In 2013 he received the Communicator award of the German Science Foundation (DFG) and the Stifterverband and in 2017 the Robert-Wichard-Pohl-Prize of the German Physical Society. He has also published popular books about the science behind football, Star Trek, and the sinking of the Titanic. Joachim Stolze, born in 1953, is Professor of Theoretical Physics at the Technical University of Dortmund.

Inhaltsangabe

Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.

Rezensionen

"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2