72,95 €
72,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
36 °P sammeln
72,95 €
72,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
36 °P sammeln
Als Download kaufen
72,95 €
inkl. MwSt.
Sofort per Download lieferbar
payback
36 °P sammeln
Jetzt verschenken
72,95 €
inkl. MwSt.
Sofort per Download lieferbar

Alle Infos zum eBook verschenken
payback
36 °P sammeln
  • Format: PDF

This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

Produktbeschreibung
This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. It is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.


Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Rezensionen
From the reviews:

"The topics covered are of current interest and include accelerated life testing and degradation models. ... The volume covers a host of applications to the field, including reliability, quality control, economics and finance. The volume is well organized, structured and presented, and the chapters appear in a logical order. It contains a lot of useful information and applications. ... the volume would be a useful resource for researchers and graduate students involved in this arena." (Technometrics, Vol. 52 (4), November, 2010)