Yoshio Waseda

Anomalous X-Ray Scattering for Materials Characterization (eBook, PDF)

Atomic-Scale Structure Determination

• Format: PDF

Produktbeschreibung

A new materials characterization methods, anomalous X-ray scattering, is presented in this book.

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Produktdetails

• Verlag: Springer Berlin Heidelberg
• Seitenzahl: 214
• Erscheinungstermin: 1. Juli 2003
• Englisch
• ISBN-13: 9783540460084
• Artikelnr.: 53172967

Inhaltsangabe

Structural Characterization of Crystalline and Non-crystalline Materials - A Brief Background of Current Requirements.- Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems - Fundamental Aspects.- Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems.- Experimental Determination of the Anomalous Dispersion Factors of X-rays - Theoretical and Experimental Issues.- In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering.- Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method.- Selected Examples of Structural Determination for Non-crystalline Materials Using the AXS Method.- Anomalous Small-Angle X-ray Scattering.- Anomalous Grazing-Incidence X-ray Reflection.- Merits of Anomalous X-ray Scattering and Its Future Prospects.