Bias Temperature Instability for Devices and Circuits (eBook, PDF)

Redaktion: Grasser, Tibor

• Format: PDF

Produktbeschreibung

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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Produktdetails

• Verlag: Springer US
• Seitenzahl: 810
• Erscheinungstermin: 22. Oktober 2013
• Englisch
• ISBN-13: 9781461479093
• Artikelnr.: 43792529

Inhaltsangabe

Introduction.- Characterization, Experimental Challenges.- Advanced Characterization.- Characterization of Nanoscale Devices.- Statistical Properties/Variability.- Theoretical Understanding.- Possible Defects: Experimental.- Possible Defects: First Principles.- Modeling.- Technological Impact.- Silicon dioxides/SiON.- High-k oxides.- Alternative technologies.- Circuits.