Circuit Design for Reliability (eBook, PDF)

Redaktion: Reis, Ricardo; Wirth, Gilson; Cao, Yu

• Format: PDF

Produktbeschreibung

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

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Produktdetails

• Verlag: Springer US
• Seitenzahl: 272
• Erscheinungstermin: 8. November 2014
• Englisch
• ISBN-13: 9781461440789
• Artikelnr.: 43784179

Inhaltsangabe

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.