Charles Chiang, Jamil Kawa

Design for Manufacturability and Yield for Nano-Scale CMOS (eBook, PDF)

• Format: PDF

Produktbeschreibung

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design's manufacturability and yield. A must read book for the serious designer.

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Produktdetails

• Verlag: Springer Netherlands
• Seitenzahl: 255
• Erscheinungstermin: 15. Juni 2007
• Englisch
• ISBN-13: 9781402051883
• Artikelnr.: 37341314

Autorenporträt

Dr. Charles Chiang is R&D Director of the Advanced Technology Group at Synopsys Inc. in Mountain View, CA, USA

Inhaltsangabe

Random Defects.- Systematic Yield - Lithography.- Systematic Yield - Chemical Mechanical Polishing (CMP).- Variability & Parametric Yield.- Design for Yield.- Yield Prediction.- Conclusions.