Daisuke Shindo, Hiraga Kenji

High-Resolution Electron Microscopy for Materials Science (eBook, PDF)

• Format: PDF

Produktbeschreibung

Materials Science Electron microscopists, researchers, graduate students

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Produktdetails

• Verlag: Springer Japan
• Seitenzahl: 190
• Erscheinungstermin: 6. Dezember 2012
• Englisch
• ISBN-13: 9784431684220
• Artikelnr.: 44058795

Autorenporträt

Materials Science Electron microscopists, researchers, graduate students

Inhaltsangabe

1. Basis of High-Resolution Electron Microscopy.- 1.1 Principles of Transmission Electron Microscopy.- 1.2 Electron Scattering and Fourier Transform.- 1.3 Formation of High-Resolution Images.- 1.4 Computer Simulation of High-Resolution Images.- References.- 2. Practice of High-Resolution Electron Microscopy.- 2.1 Classification of High-Resolution Images.- 2.2 Practice in Observing High-Resolution Images.- References.- 3. Application of High-Resolution Electron Microscopy.- 3.1 High-Resolution Images of Various Defects.- 3.2 High-Resolution Images of Various Materials.- References.- 4. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy.- 4.1 Image Processing.- 4.2 Quantitative Analysis.- 4.3 Electron Diffraction.- 4.4 Weak-Beam Method.- 4.5 Evaluation of the Performance of Electron Microscopes.- 4.6 Specimen Preparation Techniques.- References.- Appendixes.- Appendix A. Physical Constants, Conversion Factors and Electron Wavelength.- Appendix B. Geometry of Crystal Lattice.- Appendix C. Typical Structures in Materials and Their Electron Diffraction Patterns.- Appendix D. Properties of Fourier Transform.- Appendix E. Sign Conventions.