- Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis
- Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis
- Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD)
- Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity
- Offers new and innovative grain boundary descriptions and examples
This book is an ideal tool to help readers in the materials sciences develop a working understanding of the practice and applications of texture.
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