Memory, Microprocessor, and ASIC (eBook, ePUB)

Redaktion: Chen, Wai-Kai

• Format: ePub

Produktbeschreibung

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons

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Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 384
• Erscheinungstermin: 26. März 2003
• Englisch
• ISBN-13: 9781135499259
• Artikelnr.: 57531048

Autorenporträt

Wai-Kai Chen

Inhaltsangabe

System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories.
Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal
Integrity Analysis. Microprocessor Design Verification. Microprocessor
Layout Method. Architecture. ASIC Design. Logic Synthesis for Field
Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT.
ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.