This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers. The text covers the basic principles of neutron and x-ray reflectivity and different mode of neutron reflectivity with many useful examples. The reference text is helpful for research students working in the field of interface magnetism in thin film and multilayers.
Key Features:
- Introduces the reader to the field of reflectometry, especially polarized neutron reflectometry and x-ray reflectometry.
- Familiarizes researchers with the importance of interface properties in thin films.
- Demonstrates with examples how properties can be determined with sub nanometre resolution.
- Provides a summary with a large number of contemporary examples and references.
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