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"This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. ... Several important methods are presented in a clear and simple way ... . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. ... the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements." (Dejan Pantelic, Optics & Photonics News, December, 2011)