The text first details the physical aspects of image formation in microscopy, and then proceeds to tackling phase contrast, interference, and reflected-light microscopy. Next, the selection deals with the geometrical measurements and the measurement of refraction indices, thickness, and slope. The text also covers infra-red and ultra-violet microscopy, microspectroscopy, microspectrophotometry, and chemical microscopy.
The book will be of great use to physicists who specializes in optics.
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