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This book outlines the intrinsic potential of RF-MEMS technology with specific focus on 5G mobile communications and services. Commencing with a review of the characteristics of RF-MEMS in relation to the specifications of interest for 5G, the book proceeds to develop practical insight concerning the design and development of RF-MEMS including case studies of design concepts. Including multiphysics simulation and animations, the book will be essential reading for both academic and industrial researchers and engineers.
This book outlines the intrinsic potential of RF-MEMS technology with specific focus on 5G mobile communications and services. Commencing with a review of the characteristics of RF-MEMS in relation to the specifications of interest for 5G, the book proceeds to develop practical insight concerning the design and development of RF-MEMS including case studies of design concepts. Including multiphysics simulation and animations, the book will be essential reading for both academic and industrial researchers and engineers.
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Autorenporträt
Jacopo Iannacci is Researcher in MEMS technology with the Center for Materials and Microsystems (CMM) at Fondazione Bruno Kessler (FBK) in Trento, Italy, since 2007. His scientific focuses are on (compact) modelling, design, optimisation, integration, packaging and testing for reliability of RF-MEMS (Radio Frequency MicroElectroMechanical Systems) passive devices/networks, EH-MEMS (Energy Harvesting MEMS), as well as SA-MEMS (MEMS Sensors and Actuators).
He received a MSc in Electronic Engineering (2003) from the University of Bologna, Italy, and the PhD in Information Technology (2007) from the ARCES Center of Excellence at the University of Bologna, Italy, with focus on mixed domain simulation and hybrid wafer-level packaging of RF-MEMS devices for wireless applications.
In 2005 and 2006, Jacopo Iannacci worked as Visiting Researcher at the DIMES Technology Center of the Technical University of Delft, the Netherlands, where he focused on the development of packaging and integration solutions for RF-MEMS devices. In 2016, he visited the Fraunhofer Institute for Reliability and Microintegration IZM in Berlin, Germany, as Seconded Researcher, studying the integration of RF-MEMS devices and their optimisation against market requirements.
Jacopo Iannacci has authored and co-authored numerous scientific contributions for international journals and conference proceedings, as well as books and several book chapters in the field of MEMS and RF-MEMS technology.
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