Semiconductor Devices in Harsh Conditions (eBook, PDF)

Redaktion: Weide-Zaage, Kirsten; Chrzanowska-Jeske, Malgorzata

• Format: PDF

Produktbeschreibung

The book focuses on radiation, operating conditions, sensor systems, and package and system design.

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Dieser Download kann aus rechtlichen Gründen nur mit Rechnungsadresse in A, B, BG, CY, CZ, D, DK, EW, E, FIN, F, GR, HR, H, IRL, I, LT, L, LR, M, NL, PL, P, R, S, SLO, SK ausgeliefert werden.

Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 256
• Erscheinungstermin: 25. November 2016
• Englisch
• ISBN-13: 9781498743822
• Artikelnr.: 47382613

Inhaltsangabe

Section I Radiation. Commercial Off-the-Shelf Components in Space
Applications. Soft Errors in Digital Circuits Subjected to Natural
Radiation: Characterisation, Modelling and Simulation Issues. Simulation of
Single-Event Effects on Fully Depleted Siliconon-Insulator (FDSOI) CMOS.
Section II Sensors and Operating Conditions. Electronic Sensors for the
Detection of Ovarian Cancer. Sensors and Sensor Systems for Harsh
Environment Applications. III-Nitride Electronic Devices for Harsh
Environments. Section III Packaging and System Design. Packaging for
Systems in Harsh Environments. Corrosion Resistance of Lead-Free Solders
under Environmental Stress. From Deep Submicron Degradation Effects to
Harsh Operating Environments: A Self-Healing Calibration Methodology for
Performance and Reliability Enhancement. Role of Diffusional Interfacial
Sliding during Temperature Cycling and Electromigration-Induced Motion of
Copper Through Silicon Via.