R. S. Sirohi

Speckle Metrology (eBook, PDF)

• Format: PDF

Produktbeschreibung

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

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Produktdetails

• Verlag: Taylor & Francis eBooks
• Seitenzahl: 568
• Erscheinungstermin: 18. August 2020
• Englisch
• ISBN-13: 9781000104950
• Artikelnr.: 59974843

Autorenporträt

R. S Sirohi (Author)

Inhaltsangabe

Theory and applications of speckle displacement and decorrelation, I. Yamaguchi
techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi
speckle methods in experimental mechanics, Rajpal S. Sirohi
recent developments in video speckle interferometry, Ole J. Lokberg
novel applications of speckle metrology, Chandra S. Vikram
particle image velocimetry (PIV), K.D. Hinsch
white light speckle metrology, Anand K. Asundi
surface roughness evaluation, J.D. Briers
automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann
speckle metrology using hololenses, Chandra Shahker
correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.