- Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material
- Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics
- Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions
- Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement
Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
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