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The Small Book About Design-for-Test (eBook, ePUB)

A comprehensive guide to Design-for-Test methods in the semiconductor industry

• Format: ePub

Produktbeschreibung

This book is designed for individuals working in the semiconductor industry who need a fundamental understanding of Design-for-Test (DfT) methods. It caters to test and product engineers who typically utilize these methods, as well as chip designers, project managers, and business owners who seek to comprehend the value of implemented DfT methods. Additionally, it serves as a starting point for beginners in DfT before delving deeper into implementation tools and test pattern generation tasks. Originating from a university lecture, the core content of this book has expanded over the years. It bridges the gap between theoretical textbook descriptions of DfT and its practical application in the industry. The goal is to present DfT as a collection of methods that maintain manufacturing test costs at a level that allows for reasonable selling prices, even for complex products utilizing the latest silicon technologies. The book is structured into three parts: - The first part provides a summary of DfT techniques and an introduction to pattern generation techniques. - The second part delves into established DfT techniques for special analogmixed signal circuits and memories within the industry. - The third part proposes a systematic approach to test concept engineering, maximizing the benefits of DfT methodologies. By exploring the fundamentals and advanced concepts of DfT, this book aims to equip readers with the knowledge and tools necessary to contribute to the ongoing innovation in semiconductor testing and development.

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Produktdetails

• Verlag: BoD - Books on Demand
• Seitenzahl: 154
• Erscheinungstermin: 30. Mai 2025
• Englisch
• ISBN-13: 9783819236730
• Artikelnr.: 74333894

Autorenporträt

The author, with over 30 years of experience in the semiconductor industry, began his career as a DfT expert following his PhD. Throughout his professional journey, he has collaborated closely with design, test, and product engineering teams in various roles. For the past decade, the author has been a lecturer at FAU Erlangen-Nuremberg, Germany, empowering the next generation to continue innovating in test and DfT.